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Redesigned PCB for simultaneous Peltier control and surface resistance measurement

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V2_TEC

Redesigned PCB for simultaneous Peltier control and surface resistance measurement


Composition

The complex consists of two boards - Signal and Power. The power acts like as a controller of the Peltier element. Signal measures surface resistance and temperature. In the table, the top line is the signal board. Lower - power. Drawings as part of a work of art.

Signal_top Signal_back
Power_top Power_back

More details about the device can be understood from the schematic drawing here. The notes are in Russian.

The controller for the complex is STM32L432KC Nucleo.

Reference Information:

  • To control the Peltier element, a 100 kHz PWM is used.
  • IRS2104 is used to control transistors.
  • The measurement of surface resistance is carried out by the four-probe method.
  • Temperature measurement is carried out by pt100.
  • There is an additional port for the I2C protocol

4point_probe

4PP Four point probe is used to measure resistive properties of semiconductor wafers and thin films [1].

In this case are studing the I - V characteristic of an element depending on the temperature of the sample. It is important to understand the I – V characteristic near the metal-insulator phase transition (MIT), which is about 68 degrees Celsius. You must understand that the ultimate goal is to stabilize the temperature to a specific value. More about the TEC control [2]

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