Features:
2 features added: PWM separation and concurrent testing
PWM separation
Some MCUs do not have the ability to have rising and falling edge PWM triggers. We separated the PWM test into 3 separate tests:
- Rising triggers
- Falling triggers
- Rising and falling triggers
Test results now report when a specific trigger fails
Concurrent tests
Tests were designed to test specific implementations of mbed OS APIs. We added 3 additional tests to verify that crossover between APIs does not interfere. We test the following tests concurrently:
- Communication APIs: Mixes SPI and I2C devices
- GPIO APIs: Mixes analog in/out, interrupt in, and digital in/out
- Mixed APIs: Combines everything
Feature requests
Feature requests originally brought up here: