A bug in the HAL_I2C_IsDeviceReady function in version 1.11.3

[engycz]

I have found a bug in the HAL_I2C_IsDeviceReady function in version 1.11.3 fec141c.

The problem is in the function HAL_I2C_IsDeviceReady on Line 3332. There is a call to the I2C_WaitOnFlagUntilTimeout function . There is a new test for I2C_IsErrorOccurred and if so (the device is not ready and sent NACK), I2C_IsErrorOccurred waits for STOP and returns HAL_ERROR to I2C_WaitOnFlagUntilTimeout. I2C_WaitOnFlagUntilTimeout returns HAL_ERROR to HAL_I2C_IsDeviceReady and it immediately returns HAL_ERROR to the upcoming function without considering the number of Trials from the function parameter.

How To Reproduce

1. Write a data block into the EEPROM using the HAL_I2C_Mem_Write function
2. Call HAL_I2C_IsDeviceReady with the Trials parameter set to 1000
3. HAL_I2C_IsDeviceReady return value is HAL_ERROR, only one busy test is performed

Version 1.11.2 - multiple attempts to test if the device is ready (not busy)

Version 1.11.3 - only one attempt testing if the device is ready (not busy)

[KRASTM]

Hello @engycz,

Thank you for the report.

[KRASTM]

ST Internal Reference: 181377